2 year Warranty
The Ultrasonic Contact Impedance (UCI) durometer PCE-3500 has been designed for the non-destructive hardness measurement of metallic components. A 136° Vickers diamond at the probe is stimulated with its self-resonance to allow the user to very accurately measure hardness of small items, thin-walled items (>1 mm), and surface-hardened layers. Small imprint after measuring for mirrored surfaces and nitrided surfaces.
The Ultrasonic Contact Impedance (UCI) durometer PCE-3500 has been designed for the non-destructive hardness measurement of metallic components. A 136° Vickers diamond at the probe is stimulated with its self-resonance to allow the user to very accurately measure hardness of small items, thin-walled items (>1 mm), and surface-hardened layers. Small imprint after measuring for mirrored surfaces and nitrided surfaces.
PCE-5000 is a portable material hardness tester that uses the ASTM A1038 ultrasonic contact impedance (UCI) method to measure the hardness of metals and alloys with a minimum thickness of 2 mm / .08 in. Non-destructive testing produces microscopic indentation.
The Material Surface Roughness Tester PCE-RT 10 is a small, light device with simple navigation. Despite the fact that the device functions on a very complex and elaborate level, the measurement results can be acquired quickly and in an accurate way. Very simple to operate with a motorized diamond sensor.
PCE-COM 20 is a portable handheld non-destructive material tester for non-ferrous metals. This non-destructive testing (NDT) device uses eddy current to determine the electrical conductivity of non-ferrous metals such as aluminum and copper. Includes 3 standards for testing.
PCE-FD 20 is a material thickness meter with a large LCD screen that displays A-scan maps of ultrasonic signals as well as B-scan cross sections. Ideal for use in mechanical engineering, aerospace and metallurgical applications, this high-frequency material thickness meter uses a contact transducer (two different probes included; 45° and 90°) to measure material thickness and identify flaws and defects such as discontinuity in welds.
PCE-5000 is a portable material hardness tester that uses the ASTM A1038 ultrasonic contact impedance (UCI) method to measure the hardness of metals and alloys with a minimum thickness of 2 mm / .08 in. Non-destructive testing produces microscopic indentation.
The Material Surface Roughness Tester PCE-RT 10-ICA is a small, light device with simple navigation. Despite the fact that the device functions on a very complex and elaborate level, the measurement results can be acquired quickly and in an accurate way. Very simple to operate with a motorized diamond sensor.
The Ultrasonic Contact Impedance (UCI) durometer PCE-3500 has been designed for the non-destructive hardness measurement of metallic components. A 136° Vickers diamond at the probe is stimulated with its self-resonance to allow the user to very accurately measure hardness of small items, thin-walled items (>1 mm), and surface-hardened layers. Small imprint after measuring for mirrored surfaces.
With the PCE-DLT 10 test stand, the water vapour resistance of samples is tested according to AMK-MB-005 Issued on 04/2015 Humidity and Climatic Resistance Test Module 1 (water vapour loading).
PCE-COM 20-ICA is a portable handheld non-destructive material tester for non-ferrous metals. This non-destructive testing (NDT) device uses eddy current to determine the electrical conductivity of non-ferrous metals such as aluminum and copper. Includes 3 standards for testing.
The spectrophotometer PCE-CSM 10 was developed for quality control, offers a high accuracy and comes with a 3.5" touch screen display. You can choose between different color spaces like CIE L*A*B, XYZ, Yxy, LCh, LUV, LCH, LAB &WI &YI, Color Fastness, and Staining Fastness. 400 to 700 nm photodiode array for 10 nm wavelength increments with Reflectance Curve graph.
The colorimeter PCE-CSM 10 was developed for quality control, offers a high accuracy and comes with a 3.5" touch screen display. You can choose between different color spaces like CIE L*A*B, XYZ, Yxy, LCh, LUV, LCH, LAB &WI &YI, Color Fastness, and Staining Fastness. 400 to 700 nm photodiode array for 10 nm wavelength increments with Reflectance Curve graph.