The PCE-DDM 20 Force Gauge is the ideal tool for weighing big loads and for measuring strong tensile forces. The PCE-DDM 20 Force Gauge is delivered in a protective carrying case and includes two shackles made of heavy-duty steel. The instrument is manufacturer calibrated, but can be certified to ISO standards for an additional fee.
The force gauge is ideal for mobile tensile measurements, such as those carried out by surveyors. Quality materials are used in the manufacture of the force gauge. Despite the high measuring capacity, these materials enable a compact design with a low weight.
The profilometer PCE-RT 2000BT-ICA is used for accurate measurement of surface roughness. The profilometer can be used on all surfaces. The roughness is measured precisely with the roughness measuring device via the piezo probe.
The surface tester PCE-RT 2000BT-ICA is used for accurate measurement of surface roughness. The surface tester can be used on all surfaces. The roughness is measured precisely with the roughness measuring device via the piezo probe.
The roughness tester PCE-RT 2000BT-ICA is used for accurate measurement of surface roughness. The roughness tester can be used on all surfaces. The roughness is measured precisely with the roughness measuring device via the piezo probe.
The roughness tester PCE-RT 2000BT-ICA is used for accurate measurement of surface roughness. The roughness tester can be used on all surfaces. The roughness is measured precisely with the roughness measuring device via the piezo probe.
The force gauge is ideal for mobile tensile measurements, such as those carried out by surveyors. Quality materials are used in the manufacture of the tension force gauge. Despite the high measuring capacity, these materials enable a compact design with a low weight.
The material surface roughness tester PCE-RT 2000BT-ICA is used for accurate measurement of surface roughness. The material surface roughness tester can be used on all surfaces. The roughness is measured precisely with the roughness measuring device via the piezo probe.