2.365,90 €
Price excl. VAT &. delivery
The PCE-DDM 10 Crane Scale is the ideal tool for weighing big loads and for measuring strong tensile forces. The PCE-DDM 10 Crane Scale is delivered in a protective carrying case and includes two shackles made of heavy-duty aluminum (see accessories for details).
The force gage is ideal for mobile tensile measurements, such as those carried out by surveyors. Quality materials are used in the manufacture of the tension force gage. Despite the high measuring capacity, these materials enable a compact design with a low weight.
The force gauge is ideal for mobile tensile measurements, such as those carried out by surveyors. Quality materials are used in the manufacture of the tension force gauge. Despite the high measuring capacity, these materials enable a compact design with a low weight.
The PCE-DDM 10 Hanging Scale is the ideal tool for weighing big loads and for measuring strong tensile forces. The PCE-DDM 10 Hanging Scale is delivered in a protective carrying case and includes two shackles made of heavy-duty aluminum (see accessories for details).
The material surface roughness tester PCE-RT 2000BT-ICA is used for accurate measurement of surface roughness. The material surface roughness tester can be used on all surfaces. The roughness is measured precisely with the roughness measuring device via the piezo probe.
The roughness tester PCE-RT 2000BT-ICA is used for accurate measurement of surface roughness. The roughness tester can be used on all surfaces. The roughness is measured precisely with the roughness measuring device via the piezo probe.
The profilometer PCE-RT 2000BT-ICA is used for accurate measurement of surface roughness. The profilometer can be used on all surfaces. The roughness is measured precisely with the roughness measuring device via the piezo probe.
The roughness tester PCE-RT 2000BT-ICA is used for accurate measurement of surface roughness. The roughness tester can be used on all surfaces. The roughness is measured precisely with the roughness measuring device via the piezo probe.